This Quartz Inertial Device Functional & Dynamic Test and Analysis System is designed for both full-unit testing and separated component testing of high-performance quartz inertial sensors. The system allows independent or combined testing of the sensor head and circuit board, enabling precise matching and performance evaluation.
It supports functional testing such as ±1g and 0g output verification, as well as dynamic parameter analysis including natural frequency, cutoff frequency, overshoot, half-wave oscillation cycles, and damping characteristics. It also measures noise performance and installation errors. The system features a simple one-switch operation to toggle between functional testing and dynamic testing modes.