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China Moneypro Functional Dynamic Integrated Test Component

This Quartz Inertial Device Functional & Dynamic Test and Analysis System is designed for both full-unit testing and separated component testing of high-performance quartz inertial sensors. The system allows independent or combined testing of the sensor head and circuit board, enabling precise matching and performance evaluation.

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It supports functional testing such as ±1g and 0g output verification, as well as dynamic parameter analysis including natural frequency, cutoff frequency, overshoot, half-wave oscillation cycles, and damping characteristics. It also measures noise performance and installation errors. The system features a simple one-switch operation to toggle between functional testing and dynamic testing modes.

SKU: 2ba9ecc75753 Category:
Description

Product Composition

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No. Name Quantity Remarks
1 Functional dynamic tester 1
2 Digital multimeter 1
3 Signal generator 1
4 Oscilloscope 1
5 Precision hexahedron 1
6 Granite plate 1

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Main Technical Specifications

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1) High-performance quartz inertial device power supply:

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    Dual output voltage: ±15V ± 2V

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    Maximum output current: 2A

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    Ripple voltage: ≤ 75 mV

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    Square wave and sine wave within 10 MHz

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2) Measurement requirements (built-in 6½ digit multimeter):

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    Voltage measurement range: 100 μV ~ 100 V

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    Voltage measurement accuracy: 100 μV

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    Waveform display, bandwidth: 20 MHz

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3) Precision hexahedron:

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    Mounting reference surface azimuth angle: ≤ 10″

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    Mounting reference surface pitch misalignment angle: ≤ 10″

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